MNF | Publications
- Caratterizzazione SIMS ToF-SIMS e XPS di Ossidonitruri; M., Sbetti; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; 1998
- A Study of Physical properties of Vanadium Oxyde-based Gas Sensors; R., Rella; P., Siciliano; Vanzetti, Lia Emanuela; Anderle, Mariano; A., Cricenti; R., Generosi; C., Coluzza; 1998
- Low-frequency Raman scattering in model disordered solids: percolators above threshold; O., Pilla; G., Viliani; Dell'Anna, Rossana; G., Ruocco; PHYSICA. A; Vol. 247>; N. 1-4; 1997; pp. 23-29
- Improvement of mechanical properties of a-C:H by silicon addition; C., De Martino; G., Fusco; G., Mina; A., Tagliaferro; Vanzetti, Lia Emanuela; Calliari, Lucia; M., Anderle; DIAMOND AND RELATED MATERIALS; Vol. 6>; 1997; pp. 559-563
- Gate Oxide Quality Improvement Nearby Bird`s Beak Region; Bellutti, Pierluigi; Collini, Amos; Ferrario, Lorenza; Zorzi, Nicola; Zen, Mario; Proceedings of `Crystalline Defects and Contamination`, Electrochemical Society Meeting (31/08/1997 - 01/09/1997, Paris, France); 1997; pp. 204-208
- Formation of counter doped shallow junctions by boron and antimony implantation and codiffusion in silicon; Solmi, S.; Canteri, R.; Materials Research Society Symposium; Vol. 469>; 1997; pp. 6
- Analysis of the Breakdown Behaviour of Stacked Dielectric Capacitors for AC-coupled Silicon Microstrip Detectors; Boscardin, Maurizio; Luciano, Bosisio; Dalla Betta, Gian Franco; Ferrario, Lorenza; Giorgio Umberto, Pignatel; Zen, Mario; 33rd International Conference on Microelectronics, Devices and Materials [MIDEM`97] (24/09/1997 - 26/09/1997, Gozd Martuljek, Slovenia); 1997
- Structural disorder in hard amorphous carbon films implanted with nitrogen ions; Freire Jr., F. L.; Franceschini, D. F.; Achete, C. A.; Brusa, R. S.; Mariotto, G.; Karwasz, G. P.; Canteri, R.; Materials Research Society Symposium (1996); Vol. 396>; 1996; pp. 6
- Nitrogen Implantation Into Amorphous Carbon Films: SIMS and Positron Annihilation Analyses; Freire, F. L. J. r.; D. F., Franceschini; C. A., Achete; I. J. R., Baumvol; Roberto, Brusa; Gino, Mariotto; Canteri, Roberto; BRAZILIAN JOURNAL OF PHYSICS; Vol. 26>; N. 1; 1996; pp. 353-358
- Comparative analysis of high energy electron diffraction patterns from LB films of Cd- and Pb-stearates; V., Klechkovskaya; Anderle, Mariano; Renzo, Antolini; Canteri, Roberto; L., Feigin; E., Rakova; N., Stiopina; THIN SOLID FILMS; Vol. 284-285>; 1996; pp. 208-210
- Raman scattering from fractals: Simulation on large structures by the method of moments; G., Viliani; Dell'Anna, Rossana; O., Pilla; M., Montagna; G., Ruocco; G., Signorelli; V., Mazzacurati; PHYSICAL REVIEW. B, CONDENSED MATTER; Vol. 52>; N. 5; 1995; pp. 3346-3355
- Codiffusion of arsenic and boron implanted in silicon; S., Solmi; S., Valmorri; Canteri, Roberto; JOURNAL OF APPLIED PHYSICS; Vol. 77>; N. 6; 1995; pp. 2400-2406