Thomas Corradino

Biography

He received the Bachelor’s degree in industrial engineering in 2017 defending a thesis on the experimental characterization of 3D radiation sensors for neutron detection and the Master’s degree in 2020 presenting a thesis on the design and characterization of fully depleted monolithic active pixel sensors for radiation imaging. His doctoral research activity at the University of Trento, Italy, focused on
the development and characterization of monolithic active pixel sensors for radiation imaging applications realized in commercial CMOS process nodes. There, he acquired experience in the simulation of semiconductor devices with TCAD tools and in the experimental characterization of electronic devices, obtaining the Ph.D. cum Laude in Materials, Mechatronics and Systems Engineering in 2024.
He joined the FBK IRIS (Integrated Readout-ASICs & Image Sensors) research unit in 2024, where he works as a designer of Monolithic Active Pixel Sensors (MAPS) for medical, space and scientific applications, CMOS electronic circuits realized in Si and SiC and Single Photon Avalanche Diode (SPAD) arrays for scientific applications e.g. quantum imaging applications. His research activity includes the electrical, optical and functional characterization of custom CMOS electronic circuits, image sensors and radiation imaging detectors.

Expertise

• Device design by mean of TCAD simulations
• Electro-optical and functional characterization of integrated circuits, radiation detectors and image sensors
• Integrated circuit design
• Characterization of radiation detectors exploiting X-ray tubes and radiation sources

Experience

• Researcher of the IRIS Unit, Centre for Sensors and Devices at FBK, 20/02/2024 – present