Massimo Gandola

Biography

Massimo Gandola, born in Como, Italy, in 1988, is a researcher in the Integrated Readout ASIC & Image Sensor (IRIS) unit of the Center for Sensors & Devices at Fondazione Bruno Kessler (FBK).
He received his M.Sc. degree in Electronics Engineering from Politecnico di Milano in 2015 and his Ph.D. in 2019, with a focus on the development of low-noise, low-power ASICs for radiation detectors based on silicon drift detectors (SDDs) for space applications, as well as on compound materials (CdTe and CZT). From 2017 to 2021, he was a Postdoctoral Researcher at the Semiconductor Devices and Integrated Circuits (SDIC) Laboratory of Politecnico di Milano, before joining the IRIS unit at FBK in Trento. His research interests include CMOS image sensors based on SPAD and APD detectors, with a particular focus on quantum imaging, CMOS mixed-signal readout circuits for radiation detectors, and SiC (silicon carbide) CMOS technologies for operation in harsh environments.

Expertise

• Mixed-signal integrated circuits design
• Electro-optical characterization of ICs
• Characterization of readout systems for radiation detectors

Experience

• Researcher, Center for Sensors & Devices at Fondazione Bruno Kessler, 01/02/2021 – present
• Postdoctoral Researcher, Politecnico di Milano, 01/01/2019 – 30/01/2021
• Teaching Assistant (Fondamenti di Elettronica), Politecnico di Milano, 01/01/2015 – 30/01/2021
• Teaching Assistant (Circuiti Elettronici Digitali and Reti Logiche), Universita’ di Trento, 06/03/2022 – present