Damiano Giubertoni

Ricercatore MTSD | Materials and Topologies for Sensors and Devices

Contacts

+39 0461 314479

Links

ORCID

Publications

Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps; Giubertoni, Damiano; Secchi, Maria; Gupta, S.; Colaux, J. L.; Meirer, Florian; Demenev, Evgeny; Gwilliam, R.; Jeynes, C.; Parisini, A.; Gennaro, Salvatore; Vanzetti, Lia Emanuela; Iacob, Erica; Bersani, Massimo; E-MRS Spring Meeting (May 27th - May 31st, 2013, Starsbourg, France); 2013
Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab.; Iacob, Erica; Vanzetti, Lia Emanuela; Gennaro, Salvatore; Pecoraro, F.; Giubertoni, Damiano; Barozzi, Mario; Bortolotti, Mauro; Pepponi, Giancarlo; Fedrizzi, Michele; Bersani, Massimo; Ecasia 2013 15th European Conference on Applications of Surface and Interface Analysis (13-18 October 2013, Forte Village, Pula, Cagliari, Sardinia, Italy); 2013; pp. 460
Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011; E., Napolitani; Giubertoni, Damiano; Bersani, Massimo; Anderle, Mariano; A., Licciardello; 18th International Conference on Secondary Ion Mass Spectrometry - SIMS XVIII (da 09/18/2011 a 09/23/2011, Riva del Garda, Italy); SURFACE AND INTERFACE ANALYSIS; Vol. 45>; 2013; pp. 600
Preface for Proceedings of SIMS XVIII, Riva del Garda, Italy, 2011; E., Napolitani; Giubertoni, Damiano; Bersani, Massimo; Anderle, Mariano; A., Licciardello; SURFACE AND INTERFACE ANALYSIS; Vol. 45>; N. 1; 2013; pp. 1-2
Observation of Point defect injection from electrical de-activation of Arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing; Demenev, Evgeny; Meirer, Florian; Essa, Z.; Giubertoni, Damiano; Cristiano, F.; Pepponi, Giancarlo; Gennaro, Salvatore; Bersani, Massimo; Foad, M. A.; E-MRS Spring Meeting (May 27th - May 31st, 2013, Starsbourg, France); 2013
ispettiva di sorveglianza 04-05 Luglio 2013; Iacob, Erica; Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario; Vanzetti, Lia Emanuela; Fedrizzi, Michele; Bortolotti, Mauro; 2013
Evolution of Arsenic nanometric distributions in Silicon under advanced ion implantation and annealing processes; Demenev, Evgeny; Giubertoni, Damiano; 2013; pp. 143
Dynamic SIMS Characterization of Ge1-xSnx alloy; Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo; SIMS-19 The 19th International Conference on Secondary Ion Mass Spectrometry (September 29 - October 4, 2013, ICC Jeju, Jeju, South Korea); 2013
Dynamic SIMS Characterization of Ge1-xSnx alloy; Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo; SIMS-19 The 19th International Conference on Secondary Ion Mass Spectrometry (September 29 - October 4, 2013, ICC Jeju, Jeju, South Korea); 2013
Dynamic SIMS Application for Characterization of Advanced Doping Schemes in Semiconductors; Giubertoni, Damiano; Demenev, Evgeny; Meirer, Florian; Bersani, Massimo; SIMS-19 The 19th International Conference on Secondary Ion Mass Spectrometry (September 29 - October 4, 2013, ICC Jeju, Jeju, South Korea); 2013
Development of nano-roughness under SIMS ion sputtering of germanium surfaces; Iacob, Erica; Demenev, Evgeny; Giubertoni, Damiano; Barozzi, Mario; Gennaro, Salvatore; Bersani, Massimo; SURFACE AND INTERFACE ANALYSIS; Vol. 45>; N. 1; 2013; pp. 409-412
Calibration correction of ultra low energy SIMS profiles based on MEIS analysis of shallow arsenic implants in silicon; Demenev, Evgeny; Giubertoni, Damiano; M. A., Reading; P., Bailey; T. C. Q., Noakes; Bersani, Massimo; J. A., van den Berg; SURFACE AND INTERFACE ANALYSIS; Vol. 45>; N. 1; 2013; pp. 413-416