{"id":26615,"date":"2025-06-05T15:42:54","date_gmt":"2025-06-05T13:42:54","guid":{"rendered":"https:\/\/sd.fbk.eu\/?page_id=26615"},"modified":"2026-03-19T19:12:31","modified_gmt":"2026-03-19T18:12:31","slug":"equipment","status":"publish","type":"page","link":"https:\/\/sd.fbk.eu\/en\/research\/research-units\/mtsd\/equipment\/","title":{"rendered":"MTSD | Equipment"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":135,"featured_media":0,"parent":26374,"menu_order":4,"comment_status":"closed","ping_status":"closed","template":"backbone\/page-templates\/shared\/grid-of-blocks.php","meta":{"footnotes":""},"class_list":["post-26615","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.6 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>MTSD | Equipment - FBK: SD<\/title>\n<meta name=\"description\" content=\"Discover our comprehensive catalog of characterization equipment, featuring advanced machines designed for precise material analysis, testing, and research. 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Identification and quantification of elements it is also achievable in the detection limit range\r\n\r\nThe instrument operating in FBK is a Kratos Axis-Ultra\r\n","block_thumbnail":{"block_thumbnail_mode":"image","block_thumbnail_image":["26664"]},"links":[{"link_target":"_self"}]},{"block_title":"ToF-SIMS","block_description":"Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical technique that uses a pulsed ion beam to eject secondary ions from a sample's surface, which are then analyzed based on their time-of-flight to determine mass-to-charge ratios.\r\nIt provides high-resolution chemical and molecular imaging of surfaces, detecting trace elements, organic compounds, and contaminants in materials such as semiconductors, polymers, and biological samples. The technique offers ultra-high sensitivity, spatial resolution in the nanometer range, and the ability to analyze both elemental and molecular species without significant damage to the sample.\r\nThe instrument operating in FBK is a ToV-SIMS IV and in one year will be replaced by state of art a TOF-SIMS M6.\r\n","block_thumbnail":{"block_thumbnail_mode":"image","block_thumbnail_image":["26665"]},"links":[{"link_target":"_self"}]},{"block_title":"SIMS","block_description":"Atoms or groups of atoms are etched by a primary ion beam (0.25\u00f720keV). 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