The CMM offers a wide range of materials analysis related services.
For information about the materials analysis services please contact Roberto Canteri.
Materials Characterization techniques can be grouped according to different criteria and depend on the information to be obtained.
Here below an image trying to guide you through the available techniques.
Another possible way of listing the techniques according to the physical properties is shown below.
+ static – ToF-SIMS
+ dynamic – SIMS
|Proton Transfer, PTRMS|
|Fourier Transform IR (FTIR)|
|X-Ray Photoelectron Spectroscopy (XPS)|
|Auger Elecron Spectroscopy (AES)|
|X-Ray Emission spectroscopy:
+ X-Ray Fluorescence (XRF)
+ Energy dispersive spectroscopy (EDXRS)
|Scattering||X-Ray diffraction (XRD)|
|X-Ray reflectivity (XRR)|
|Electron Backscatter diffraction (EBSD)|
|Scanning Electron Microscopy (SEM)|
|Scanning Probe Microscopies (SPM):
+ Scanning Atomic Force (AFM)
+ Scanning Capacitance Microscopy (SCM)
+ Kelvin Probe Force Microscopy (KPFM)
+ Tip Enhanced Raman Spectroscopy (TERS)
+ Tip Enhanced Photoluminescence (TEPL)
+ Scanning near field optical microscopy (SNOM)
|Micro–X-ray Fluorescence analysis (Micro XRF)|
Details about the instrumentation used for the various techniques can be found in the Infrastructure pages.